Fringe Field of an asymmetrical parallel capacitor

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I have a problem bothering me for a long time. Here it is: suppose I have an asymmetrical parallel plate capacitor with one electrode much larger than the other. For example, the capacitor could be made by depositing small-area metal electrode on heavily doped wafer with 300 nm thermal oxide. Is there a way to calculate the fringe field component parallel to the SiO2 surface at the edge of the small metal electrode? A figure is attached to make the question clear. Thanks.
 

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The bottom electrode seems large enough to consider as an infinite plane.
Then you could use an image electrode, so the the field would be that of a capacitor with a
6 nm gap.
 
Thanks. Could you please give some details on how you got the 6 nm thickness?
 
Sorry I am still a little bit confused. Is the field calculated with 600 nm thickness vertical or horizontal? I am interested in the horizontal fringe field.
 
Thanks, I will try that.