How is this transistor been killed?

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The discussion focuses on the potential damage to a transistor during three specific tests involving voltage application to the base, emitter, and collector. Tests 1 and 3 are highlighted as particularly risky, with Test 3 being the most likely to cause failure due to the absence of current limiting. There is confusion regarding the term "pump in correct voltage," which is interpreted as connecting to a low output impedance supply. Questions arise about the specific voltage values used in the tests and how Test 2 could lead to damage. Overall, the conversation emphasizes the importance of managing current levels to prevent transistor failure.
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This is a homemade failure and i need to find out how is the transistor damaged after summited to these 3 tests:

test 1. base: pump in correct Vbb
emitter: grounded
collector: open

test 2. base: open
emitter: open
collector: pump in correct Vcc

test 3. base: pump in correct Vbb
emitter: grounded
collector: pump in correct Vcc

Can any1 explain to me how is the transistor damage by these tests.
 
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Either of tests 1 and 3 could kill it if you just applied voltages without any respect to current levels. Test 3 is the most likely (almost garanteed to) kill it if nothing is provided to limit the current.

BTW. What was the value of Vbb that you used anyway?
 
How could test 2 possibly kill it?

I don't understand what is meant by "pump in correct [voltage]". So, I just assume that means connect to some supply voltage (with low output impedance as alluded to by uart).
 
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