Is my device's capacitance or resistance causing a measurement problem?

AI Thread Summary
The discussion centers on measuring capacitance and resistance in a device suspected to be a capacitor, where measurements showed a capacitance range of 1.5-2.5nF and a resistance of 1.34MOhm. It highlights that real capacitors exhibit non-ideal behavior, including resistance in parallel and series due to leads, which can affect measurements. The use of an LCR meter is noted, emphasizing that it measures impedance and phase angle, which can lead to misleading values if not properly interpreted. Variability in measurements may indicate issues with noise, resolution, or instrument settings, such as autoranging and compensation for test fixtures. Proper analysis of raw impedance data and adjustments to bias levels are recommended for accurate results.
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I did some device that should be capacitor. when i try to measure capacitance I got some capacitance that varies like that:(1.5-2.5nF), but.. then i wanted to check resistance just for curiosity.. I got some result..it shows me 1.34MOhm. How it could be? As I understand it should be or capacitance or resistance..I just wanted to understand the circuit of my device. What is what? capacitor and resistor parallel or series? how can i check it?
 
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No capacitor is ideal (i.e. infinite resistance). Depending on what type of capacitor it is, I can imagine various real, non-infinite resistance values. There is always resistance in parallel with the ideal capacity (insulators are imperfect) and a series resistance due to the leads. Can't avoid these.

If you are using an LCR meter to make this measurement, you have to remember it only really measures |Z| and theta. So if you get a bizarro value (e.g. negative resistance or capacitance) it's often because everything else is model and algebra dependent extrapolating from |Z|-theta raw data. Garbage-In-Garbage-Out.

Having such a large variance sounds like a noise/ranging/resolution problem. What instrument are you using to measure this? If you are using something like an HP/Agilent 4284A, it should have no problem with measure device values range but you'd need to autorange. Also: did you compensate your test fixture/cables? That can mess things up also. I'd also look at the raw |Z|-theta data first (this is how you can find bad compensation) and check your bias/osc levels (if your device is small, you may need more AC bias level, or less DC bias - if your LCR supports that).
 
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