Discussion Overview
The discussion revolves around finding a small signal bipolar junction transistor (BJT) with low collector leakage current when biased at approximately 0.2V. Participants explore the implications of leakage current in circuit design, particularly in applications involving current limiting and offset issues in amplifiers.
Discussion Character
- Technical explanation
- Debate/contested
- Experimental/applied
Main Points Raised
- One participant seeks a BJT with low leakage current and low collector capacitance, specifically mentioning issues with the BC546, BC556, KSA992, and KSC1831 transistors.
- Another participant notes that leakage in bipolar transistors is often limited by perimeter-dependent leakage, suggesting that transistors designed for high temperatures may be more suitable.
- A participant explains that the base-emitter junction does not turn on abruptly at 0.6-0.7V, and that current increases exponentially from 0V, indicating that some leakage is expected at 0.25V base bias.
- Alternative circuit configurations, such as using a B-E resistor or a Common Base stage, are proposed to mitigate leakage issues.
- One participant describes their experimental setup and findings, indicating that the leakage current may not be the primary issue affecting output offset.
- Suggestions are made to use a Germanium diode in series with resistors to address the leakage problem.
- Concerns are raised about the design implications of using a Darlington configuration due to its inherent leakage characteristics.
- Participants discuss the challenges of modifying existing PCB layouts and the potential need to find a better transistor or remove components to resolve the leakage issue.
- There is mention of varying datasheets for the same transistor model, indicating potential inconsistencies in specifications.
Areas of Agreement / Disagreement
Participants express differing views on the best approach to mitigate leakage current, with no consensus on a single solution. The discussion includes various proposed methods and circuit configurations, but participants do not agree on a definitive resolution to the leakage issue.
Contextual Notes
Participants note that the effectiveness of proposed solutions may depend on specific circuit configurations, component values, and the characteristics of the transistors used. The discussion highlights the complexity of addressing leakage current in practical applications.