Discussion Overview
The discussion revolves around measuring the jitter of a pulse generator that produces negative Gaussian pulses. Participants explore various methods and considerations for accurately assessing jitter using an oscilloscope, particularly focusing on the capabilities of the Lecroy WR620Zi model. The conversation includes technical details about measurement techniques, the impact of equipment jitter, and the challenges of achieving precise measurements in the sub-nanosecond range.
Discussion Character
- Technical explanation
- Debate/contested
- Mathematical reasoning
Main Points Raised
- One participant describes using delta delay measurement on the oscilloscope to assess jitter, questioning if the standard deviation provided is the jitter they are looking for.
- Another participant expresses skepticism about the effectiveness of the proposed measurement method, citing the potential jitter of the oscilloscope itself as a limiting factor.
- Clarification is provided regarding the term "fwhm," defined as full width at half maximum, and the possibility of subtracting the oscilloscope's jitter from the total measured jitter to obtain the real jitter of the device under test.
- Discussion includes the use of "infinite persistence" on the oscilloscope to visualize jitter by overlaying multiple traces, with a participant explaining how this mode can help measure the spread of the signal.
- Concerns are raised about the inability to determine the scope's jitter without a control pulse generator that has negligible jitter.
- Suggestions are made to use a good timebase or a counter to measure jitter, with some participants noting that modern counters can resolve time intervals down to about 20ps.
- Participants discuss the requirements for measuring sub-nanosecond pulses, emphasizing the need for high-performance equipment with low jitter specifications.
Areas of Agreement / Disagreement
Participants express a range of views on the effectiveness of different measurement techniques and the limitations posed by equipment jitter. There is no consensus on a definitive method for measuring jitter, and multiple competing approaches are discussed.
Contextual Notes
Participants note the challenges of measuring jitter in the context of sub-nanosecond pulse widths, highlighting the importance of equipment specifications and the potential impact of the oscilloscope's own jitter on measurements.
Who May Find This Useful
This discussion may be useful for engineers and technicians involved in high-speed signal measurement, particularly those working with pulse generators and oscilloscopes in the sub-nanosecond range.