Solution to Ellipsometry Analysis Exercise

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hi all
im trying to solve this exercise of ellipsometry.
given:
the figure show the spectrum of ellipsometry of a twoo thin films Si3N4 and Si deposed on a substrat of INP.
in which order are deposed those thin films: 1- Si3N4/Si/InP
or 2- Si/Si3N4/InP
need justification.


here are the figures in the attachement ( figure 1, 2 and 3)
 

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