Thin Film Thickness: Estimating Using Transmittance & Reflectance

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SUMMARY

The discussion centers on estimating thin film thickness using transmittance and reflectance data. A widely recognized method for this purpose is ellipsometry, which provides a reliable approach for measuring film thickness. The conversation highlights the importance of utilizing specific software tools that can analyze optical data effectively. Participants emphasize the need for accurate data collection to ensure precise thickness estimations.

PREREQUISITES
  • Understanding of thin film optics
  • Familiarity with transmittance and reflectance concepts
  • Knowledge of ellipsometry techniques
  • Experience with optical data analysis software
NEXT STEPS
  • Research ellipsometry software options for thin film analysis
  • Learn about the principles of optical interference in thin films
  • Explore advanced techniques for data collection in transmittance and reflectance
  • Investigate the application of spectroscopic methods in thickness estimation
USEFUL FOR

Researchers, optical engineers, and materials scientists involved in thin film technology and characterization will benefit from this discussion.

Ahmed Khodiri
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Is there any program can estimate the thickness of thin film using transmittance and reflectance data ?
 
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