Ahmed Khodiri
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Is there any program can estimate the thickness of thin film using transmittance and reflectance data ?
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The discussion centers on estimating thin film thickness using transmittance and reflectance data. A widely recognized method for this purpose is ellipsometry, which provides a reliable approach for measuring film thickness. The conversation highlights the importance of utilizing specific software tools that can analyze optical data effectively. Participants emphasize the need for accurate data collection to ensure precise thickness estimations.
PREREQUISITESResearchers, optical engineers, and materials scientists involved in thin film technology and characterization will benefit from this discussion.