EMP deactivates electronic devices by generating large voltages that can damage their internal components. Solid-state devices are particularly vulnerable as modest voltages can disrupt their p-n junctions. In contrast, vacuum tubes and some military-grade solid-state devices exhibit greater resistance to EMP effects. However, devices connected to long wires, such as power lines or antennas, are at higher risk due to the potential for large currents that can cause physical damage. Understanding these mechanisms is crucial for assessing the impact of EMP on various electronic systems.