Four Terminal Sensing Measurement for Printed Conducting Inks

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The discussion focuses on measuring the conductivity of printed conducting inks using a four terminal sensing measurement method. The user plans to deposit four aluminum strips on substrates to facilitate this measurement, but notes that the distances between the probe points are equal, which differs from typical configurations. They inquire whether to apply Ohm's law directly or use a correction factor as suggested in referenced literature. A response suggests that the large probe contact area may affect results and recommends considering a standalone four-point probe for more accurate measurements. The conversation highlights the complexities of accurately measuring conductivity in printed materials.
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I am currently working on printing conducting inks. After printing and sintering the inks my goal is to measure conductivity of my printed patterns. Therefore I want to create 4 strips of aluminium using deposition on my substrates before I print my ink.
I want to use these strips to perform a four terminal sensing measurement on the conductivity of my printed ink strips. In most documentation I find that the distance between points 1-2 and 3-4 in the image below is smaller than the distance between points 2-3.
220px-Four-point.png


However the mask I created for depositing the aluminium on my substrates leaves four strips of aluminium with equal distances (see image below) 10 mm from center to center.
[PLAIN]http://image.bayimg.com/hapbaaach.jpg
the strips of aluminium left on the substrate will have a width of 1.5 mm.

The actual question is whether I can use R=U/I, simply ohms law, or whether I need to use a correction factor like discussed in Haldor (please refer to attachment), R=G * U/I.

The strips I will be printing across the aluminium strips will have a width of 100-1000\mum depending on my printing settings. the thickness of my print will be approx 10 times smaller.

I hope I cleared out my question, If you need anything else please let me know.

Thank you :)

Attachment: Haldor
http://dl.dropbox.com/u/1073056/Handige%20eBooks/Haldor%20weerstandsbepaling.pdf"
 
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My expertise in 4 Point Probe Measurement technique is rather limited, however, I believe that you may have some problems with the fact that the probe contact area looks to be rather extensive. Depending on deposition technique and process conditions, you may also need to factor in the resistance of the aluminum probes themselves.

Given that these seem to be rather large samples, could you just use a stand-alone 4 point probe (with, say, 0.25 to 1 mm spacing) instead of embedding electrodes? It'd also reduce your per-sample cost (if that's at all a concern).

If you can get a copy, the reference I have in my notes from my Thin Films class is Mott and Davis' Electronic Processes in Non-Crystalline Materials (even if it's from 1979).
 
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