Have electrons been used to image electrons or ions?

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    Electrons Image Ions
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Discussion Overview

The discussion revolves around the possibility of using electrons to image electron or ion beams, particularly in the context of transmission electron microscopy and related techniques. Participants explore the theoretical and practical implications of such imaging, including stability of beams and potential phase shifts.

Discussion Character

  • Exploratory
  • Technical explanation
  • Debate/contested

Main Points Raised

  • One participant seeks references for imaging electron or ion beams using electrons, suggesting a focus on transmission electron microscopy.
  • Another participant questions the purpose of such measurements, noting that electron microscopes typically require stationary objects for high-resolution imaging.
  • Concerns are raised about the stability of electron or ion beams when exposed to high-energy electrons, such as 200 keV.
  • Beam-beam interactions in colliders are mentioned as a relevant effect in this context.
  • A participant proposes that charged particle beams produce an electrostatic potential, which could be imaged using phase contrast electron microscopy or electron holography.
  • There is a question regarding the impact of the Bohm-Aharonov effect on phase shifts during imaging.
  • A reference to Marco Beleggia's work suggests that magnetic fields from currents orthogonal to the electron beam may not induce phase shifts, although uncertainty remains about this claim.
  • A participant expresses a lack of expertise in electron microscopy, indicating that geometric details may complicate the discussion.

Areas of Agreement / Disagreement

Participants express differing views on the feasibility and implications of imaging electron or ion beams with electrons. There is no consensus on the purpose of such measurements or the effects of various factors like phase shifts and beam stability.

Contextual Notes

Participants highlight the complexity of imaging techniques and the potential for various effects, such as beam stability and phase shifts, to influence outcomes. Specific assumptions and conditions related to the imaging process remain unresolved.

Philip Koeck
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I'm looking for images of electron or ion beams recorded (from the side) using electrons, for example with a transmission electron microscope. Does anybody have references to publications?
 
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I'm not sure what the point would be of such a measurement.
When I think of imaging with electrons, I think of electron microscopes - of which there are half a dozen basic types.
https://en.wikipedia.org/wiki/Electron_microscope

But in all cases, the object being scanned is held still in order to get a very high resolution image.

You can Google on: electron ion collision cross section
But most of those articles are either behind paywalls or focus on electron capture instead of deflection.
 
.Scott said:
I'm not sure what the point would be of such a measurement.
When I think of imaging with electrons, I think of electron microscopes - of which there are half a dozen basic types.
https://en.wikipedia.org/wiki/Electron_microscope

But in all cases, the object being scanned is held still in order to get a very high resolution image.
One thing I want to know is how stable the electron or ion beam is while it's exposed to let's say 200 keV electrons.
 
You have effects of beam-beam interactions in colliders.
 
mfb said:
You have effects of beam-beam interactions in colliders.
I'm thinking more along these lines: An electron or ion beam produces an electrostatic potential. In phase contrast electron microscopy and electron holography you can get images that are roughly proportional to the projected potential of the specimen. I'm wondering if anybody has imaged the potential produced by a charged particle beam using phase contrast electron microscopy or electron holography.
 
Would there not be significant and unwanted phase shifts from the Bohm-Aharanov effect?
 
Not sure. I was told by Marco Beleggia that the magnetic field from a current orthogonal to the electron beam of the microscope will not lead to a phase shift of the electron beam. He's worked a lot on phase shifts due to magnetic fields, such as for an electron microscope phase plate, but I really don't know.
Here's Marco's paper:
https://www.researchgate.net/publication/313434493_Tunable_Ampere_phase_plate_for_low_dose_imaging_of_biomolecular_complexes
 
The devil is in the geometric detail and I am not expert in electron microscopy, so I certainly don't know! Just one more thing to consider..
 

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