The central diffraction maximum is the central peak in a diffraction pattern that occurs when a wave passes through a narrow slit or aperture. It is the brightest and most intense point in the pattern.
The width of the central diffraction maximum is measured by finding the distance between the first dark fringe on either side of the central maximum. This distance is known as the width at half-maximum (WHM).
The width of the central diffraction maximum is affected by the wavelength of the incident wave, the size of the slit or aperture, and the distance between the slit or aperture and the screen where the diffraction pattern is observed.
The width of the central diffraction maximum can be calculated using the formula WHM = (λL)/d, where λ is the wavelength of the incident wave, L is the distance between the slit or aperture and the screen, and d is the width of the slit or aperture.
Yes, the width of the central diffraction maximum can be adjusted by changing the size of the slit or aperture or by changing the distance between the slit or aperture and the screen. It can also be adjusted by using different wavelengths of light.