Studiot said:
Many thanks for this answer. I have now had time to review this website with the following results.
Comparing this website with the one I linked to in post#21 of this thread I think that 'Ratch' and 'Ratchit' are one and the same person. I note he signs himself Ratch in cabraham's E-Tech thread, although his handle is 'ratchit'.
In June 2008 he started the thread I linked to (post#21) by referring to your site (amasci) as proof that 'transistors are voltage controlled not current controlled'.
There was significant discussion, including the nature of the term 'control', though not of the gargantuan proportions of the one in 2010 in cabraham's link.
I apologise to claude if we had primed the pump for that argument in 2008.
I felt that his summary in post#39 here was particularly good.
However I would take issue with equations posted in post#50.
My version of equation (3) has another term which is significant in certain types of transistor and reminds us that there are other agents that affect, and therefore can 'control', the collector current.
3) Ic = alpha*Ie + Ico
go well
Thanks for your feedback. I am well aware of the additional "Ico" term in eqn 3), & what you've presented is correct. But when we describe quantities that "control" a device, we are not usually referring to leakage & other parasitic flaws.
In a bjt, the objective is to control collector current w/ some sort of input signal, as found in uctlrs, transducers, photodiodes, etc. The inherent leakage current Ico, which exists due to the non-ideal nature of the reverse biased c-b jcn, is present & varies greatly w/ temp.
Of course Ico plays a role in determining Ic, but it is not something we use to control Ic. It is an inherent property of the bjt, one which fortunately has a very small influence on bjt Ic behavior, for silicon material.
In the 1950's when germanium was the dominant bjt material, Ico was a real problem at medium to high temps. Designers had to account for the large Ico c-b leakage when employing Ge devices at temps above 50 or 75 C. The limit was around 100 C.
Then silicon replaced Ge around 1959, & Ico for Si is generally small enough to neglect. Again, it's there, but Si devices can operate to the mil temp range of 125 C & beyond w/o Ico being too large an eror. It is an error term for sure, & your eqn is more precise than the simplified version I presented.
But Ico, & I believe I'll get universal backing/concensus on this, is NOT a "control" quantity. It influences Ic for sure, but we don't control Ic by setting a value for Ico. I think this whole question revolves around the meaning of "control".
Ib, Vbe, Ie, Vbc, Ies, Vt, Ico, etc., all have influence over Ic depending how the device is driven. If the b-e jcn is driven by a true current source or voltage source w/ a large series resistor, then Vt, & Ies determine the Vbe value at a given temp. Also, Ico adds to whatever Ic value is obtained from eqn 1) or 3).
Which quantity are we adjusting to get a specific value of Ic? That is what we mean by control. Again, your version of eqn 3) is more precise than my simplified version. Ico exists indeed & influences Ic. But if Ico is 2.7 uA, & we bias the bjt at Ic value of 1.0 mA, the error is just 0.27%. For larger Ic value, the error is less.
Again, w/ Ge devices, the presence of large Ico values forced the designer to take it into consideration. Circuit topology was built around the need to mitigate large Ico values. EEs from the 1950's can give you insight into this practice. BR.
Claude