Do suspended sub-micron sized particles influence the index of refraction of a liquid?
tech99 said:This is what I suggest is happening. If the particles are smaller in diameter than lambda/pi then they are too small for resonance. This means they are inductive. The incident E-field causes a circumferential current on the surface of the particle and this current lags the E-field by 90 degrees. The current results in radiation which is 90 degrees delayed relative to the incident E and B waves. So the radiation from the particles is slower than free space. This gives the material an increased Index of Refraction.
Suspended particles are small particles that are dispersed in a medium, such as air or water. They can be solid, liquid, or gas and can vary in size from nanometers to micrometers. These particles can affect the index of refraction by scattering light, which alters the path and speed of light as it passes through the medium.
The index of refraction is dependent on the physical properties of the suspended particles, such as their size, shape, and composition. Different types of particles can have different refractive indexes, which can affect the overall index of refraction of the medium they are suspended in.
The concentration of suspended particles can have a direct impact on the index of refraction. As the concentration increases, there are more particles present to scatter light, resulting in a higher index of refraction. Conversely, a decrease in concentration can lead to a lower index of refraction.
Suspended particles can reduce the transparency of a medium by scattering and absorbing light. When light passes through a medium with suspended particles, the particles can scatter the light in different directions, making it more difficult for light to pass through and decreasing the transparency of the medium.
Yes, the index of refraction of a medium with suspended particles can be calculated using the concentration and physical properties of the particles. However, the calculation may be complex and may require specialized equipment to accurately measure the index of refraction in the presence of suspended particles.