How to treat the "ideal" plate capacitor more rigorously?

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Discussion Overview

The discussion revolves around the treatment of the ideal parallel-plate capacitor, specifically addressing the inconsistencies in its derivation and the implications of boundary effects. Participants explore theoretical, mathematical, and practical aspects of capacitor behavior, including the effects of fringing fields and the validity of commonly used formulas.

Discussion Character

  • Exploratory
  • Technical explanation
  • Debate/contested
  • Mathematical reasoning

Main Points Raised

  • One participant questions the consistency of the derivation of the capacitor's capacity, noting the conflicting assumptions of infinite plate size for electric field calculations and finite area for charge expressions.
  • Another participant asserts that the electric fields outside a finite capacitor are not zero and introduces the concept of fringing effects, suggesting numerical techniques for analyzing realistic geometries.
  • A participant expresses a desire to understand why the formula ##C=\varepsilon\frac{A}{d}## remains acceptable despite its inconsistencies, citing manufacturing errors as a reason for its practical use.
  • There is a request for a quantitative estimation of errors due to fringing effects, leading to a suggestion of using finite element method (FEM) analysis.
  • Participants discuss historical justifications for capacitor derivations before modern analytical techniques, speculating on possible approximations used in early electromagnetism.
  • One participant mentions the use of conformal mapping to analytically compute fringe fields for a 2D capacitor, noting that fringing fields become negligible when spacing is small compared to width.
  • Guard rings are introduced as a method to reduce fringe fields, although their use is noted as a workaround rather than a solution to the original question of rigorous mathematical treatment.

Areas of Agreement / Disagreement

Participants express differing views on the treatment of boundary effects and the validity of existing formulas. There is no consensus on how to rigorously address the inconsistencies raised, and multiple competing perspectives remain throughout the discussion.

Contextual Notes

Participants acknowledge limitations in the current understanding of boundary effects and the historical context of capacitor derivations, but do not resolve these issues. The discussion reflects a range of assumptions and conditions that influence the analysis of the ideal capacitor.

greypilgrim
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Hi.

The derivation of the capacity of an ideal parallel-plate capacitor is inconsistent: On the one hand, the plates are assumed to be infinitely large to exploit symmetries to compute an expression for the electric field, on the other the area is finite to get a finite expression for the charge. Usually this is justified by the fact that the boundary only increases with the square root of the area and hence boundary effects can be neglected.

However, this can be tricky: An ideal, finite capacitor doesn't even agree with Maxwell's equation since the line integral of the electric field from one plate to the other is path-dependent (##E\cdot d## for paths between the plates, zero for paths outside). When it comes to voltage or work, boundary effects clearly cannot be neglected.

How can this subject be treated more rigorously than just what seems to me to pick and choose when to neglect boundary effects and when not to?
 
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The fields outside are not zero for a finite capacitor, and the work is path independent. We say that there is a fringing effect at the boundary. Numerical techniques are used for realistic geometries for electrostatics and magnetostatics.
For example this person has used the finite difference method to produce the fields of a finite capacitor.
http://www.drjamesnagel.com/EM_Beauty.htm
Capacitor.jpg
 

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I know all this (except for the exact term fringing effect, due to English not being my first language). Nevertheless, the derivation of the widely used formula ##C=\varepsilon\frac{A}{d}## is inconsistent due to the reasons I stated and I'd like to get a better understanding why it's still acceptable for most applications.
 
greypilgrim said:
I'd like to get a better understanding why it's still acceptable for most applications.
Because generally the errors produced by neglecting the fringing effect are less than the errors in manufacturing the specified A and d.
 
Can you make a quantitative estimation about the errors produced by the fringing effect?
 
Sure. The usual way is to do a FEM analysis like the one mentioned by @MisterX above, then make small changes to the parameters
 
And how did people justify this derivation back in the early days of electromagnetism when those techniques weren't available?
 
That I don’t know. I am not aware of any analytical techniques for it. Perhaps they approximated it as a dipole as a worst case?
 
A similar example is using Ampere's law to find an expression of the magnetic field inside a long solenoid.
 
  • #10
For a 2D capacitor (long parallel strips) you can compute the fringe fields analytically using conformal mapping. For spacing small compared to width, the fringing fields are negligible.
 
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  • #11
Guard rings ?
I've vague memories of a Uni PhysLab session where there were co-planar guard rings just outside the circular 'standard' electrodes...
I've equally vague memories of later seeing circuit for an 'active' guard-ring set-up using op-amps...
Ideas ??
 
  • #12
Guard rings eliminate (or greatly reduce) the fringe fields, so are useful for standard capacitors as used by the old National Bureau of Standards. This skirts, rather than addresses, the OP question of mathematically treating a capacitor of finite area.
 

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