Solving Interference Issues in Circuit Testing

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Discussion Overview

The discussion revolves around addressing interference issues in circuit testing, specifically when measuring resistance in a material that is also subjected to heating. Participants explore the implications of simultaneous operation of heating and measurement circuits, considering various components and methods to mitigate interference.

Discussion Character

  • Technical explanation
  • Debate/contested
  • Experimental/applied

Main Points Raised

  • Scott describes a circuit design that heats a material and then measures its resistance, questioning whether power transistors are sufficient to prevent interference between heating and measuring circuits.
  • Another participant asks if it is possible to measure current and voltage while heating the material simultaneously, implying a potential for concurrent operation.
  • Scott expresses concern that the changing current from the heating circuit could alter the voltage drop across the material, affecting the accuracy of the resistance measurement in the four-wire Kelvin setup.
  • Scott suggests the use of relays as a possible solution and inquires about their average switching speed, indicating a need for timing considerations in the circuit design.

Areas of Agreement / Disagreement

Participants do not reach a consensus on the best approach to mitigate interference, with multiple competing views on whether simultaneous operation is feasible and how to implement it effectively.

Contextual Notes

Limitations include uncertainty regarding the effectiveness of proposed solutions, such as the use of transistors versus relays, and the impact of switching speeds on measurement accuracy.

Who May Find This Useful

Individuals involved in circuit design, particularly in experimental physics or engineering applications where precise measurements are critical, may find this discussion relevant.

scott_alexsk
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Hello,

I am making a circuit which runs a large current through a material at intervals, heating it, which then temporarily stops to make a resistance measurement. Each individual circuit is not an issue in itself, nor the timing of it since I have a computer interface which can grab analog values and produce digitial 1s.

The issue I need to address is the interference of each circuit's operation with the other's. Do I need to just put a power transistor on each series of connections to the material I am testing for each part of the circuit, or do I need to do something more complicated?

So in other words can I just, let's say, turn on the circuit which measures resistance, by providing an appropriate input to that transistor(or FET) and turn off the section which provides the heating current by providing another input to the other controlling transistor, without the heating circuit significantly interfering with the measuring circuit or vice-versa?

Thanks,
-Scott
 
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Can you just do both simultaneously? Can you measure current and voltage being applied to the material as you are heating it?
 
Well wouldn't that the changing current from my heating circuit, cause the voltage drop to be different across the material, which would in turn provide a different value than expected for my four-wire kelvin circuit, which is simultaneously hocked up to the material. Perhaps I can use relays, what is the average switching speed on those guys?

Thanks,
-Scott
 
scott_alexsk said:
Well wouldn't that the changing current from my heating circuit, cause the voltage drop to be different across the material, which would in turn provide a different value than expected for my four-wire kelvin circuit, which is simultaneously hocked up to the material. Perhaps I can use relays, what is the average switching speed on those guys?

Thanks,
-Scott

Small relays bounce for a few ms, typically.
 

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