Angle of incidence and X-rays

In summary, the problem involves finding the angle of incidence for x-rays of wavelength 0.708A incident on calcite that will result in total reflection. Using Bragg's law, an angle of -45.07 degrees is obtained, but since n is the refractive index and not an integer, Bragg's law cannot be used. Instead, total internal reflection can be applied by finding an angle greater than the critical angle, which can be calculated using the equation thetacrit=arcsine(n1/n2). However, the wavelength of the x-rays does not affect the solution.
  • #1
Quelsita
49
0
Problem:
The index of refraction for x-rays of wavelength 0.708A incident on calcite is 1-1.85E-6. What angle of incidence will give total reflection of such X rays?


Using Bagg's Law: n(lambda)=2asin(theta), I get and angle of -45.07 degrees.
Is this all that is required of the problem...is it that simple?

Thanks.
 
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  • #2
That's the wrong "n".

Bragg's law: n = any integer

But here n is the refractive index, not an integer. So Bragg's law doesn't apply.

What equation in optics deals with refractive index and angle of incidence? You might also look into "total internal reflection"
 
  • #3
Redbelly98 said:
What equation in optics deals with refractive index and angle of incidence? You might also look into "total internal reflection"

OK, so with total internal reflection since we are looking for and angle that gives total reflection, so we want an angle greater than the critical angle, and since this means that (n1/n2) would be greater than 1, we cannot use Snell's Law: n1sin(theta1)=n2sin(theata2).

But if we let theata2=90, then we can solve for the critical angle:
thetacrit=arcsine(n1/n2)

-Is this correct?
-How does the wavelength of the X-ray apply?
 
  • #4
Your equation is correct.

The wavelength doesn't apply.
 
  • #5
Ok. So is the second medium just air where n2=1?
 
  • #6
Ah, good question. Not sure what n is for x-rays in air. For optical wavelengths it's 1.0003.

But yes, the second medium is air.
 

1. What is the angle of incidence for X-rays?

The angle of incidence for X-rays is the angle at which the X-rays strike a surface or material. It is measured relative to the normal, which is a line perpendicular to the surface of the material.

2. How does the angle of incidence affect X-rays?

The angle of incidence affects X-rays by determining the amount of energy that is absorbed, transmitted, or reflected by the material. The greater the angle of incidence, the more energy is absorbed by the material.

3. Can the angle of incidence be changed for X-rays?

Yes, the angle of incidence for X-rays can be changed by altering the position or orientation of the X-ray source or the material being examined. This can be done manually or with specialized equipment.

4. What is the relationship between angle of incidence and X-ray diffraction?

The angle of incidence is an important factor in X-ray diffraction, as it affects the diffraction pattern produced by the material. A change in the angle of incidence can result in a different diffraction pattern, providing valuable information about the material's structure.

5. How is the angle of incidence measured for X-rays?

The angle of incidence for X-rays is typically measured using specialized equipment, such as an X-ray diffractometer. This equipment uses a goniometer to precisely measure the angle of incidence at which the X-rays strike the material.

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