Determining the behaviour of a wafer from the CV curves

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To determine the behavior of thin film semiconductor wafers from CV measurements, it's essential to analyze the shape and characteristics of the CV curves. Key indicators include the capacitance values, peak positions, and the slope of the curves, which can reveal information about charge carrier density and mobility. Sharing the CV data in a PDF format is recommended for better accessibility and security. Participants in the discussion are encouraged to provide insights based on the specific readings shared. Understanding these parameters is crucial for evaluating the performance of the semiconductor wafers.
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After conducting CV measurements on Thin Film semiconductor wafers, how do we determine the behavior of the wafer based on the measurements? I have a sample of the reading obtained. I would be glad if anyone can help me.
 

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bhavi said:
After conducting CV measurements on Thin Film semiconductor wafers, how do we determine the behavior of the wafer based on the measurements? I have a sample of the reading obtained. I would be glad if anyone can help me.

Welcome to the PF. You should post a PDF file instead of a ZIP file. Less likely to have virus problems that way.
 
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