Thin film asymmetrical grazing angle XRD

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SUMMARY

The discussion centers on conducting symmetrical grazing angle X-ray diffraction (XRD) on carbon thin films using the Bruker D8 Discover system. Participants seek guidance on transitioning from asymmetric grazing angle measurements, which primarily capture out-of-plane diffraction patterns, to in-plane symmetric measurements that assess diffraction from planes parallel to the substrate. One user suggests that the in-plane symmetric mode may resemble a locked couple mode, indicating a need for clarification on this technique.

PREREQUISITES
  • Understanding of X-ray diffraction techniques, specifically grazing angle XRD.
  • Familiarity with the Bruker D8 Discover XRD system.
  • Knowledge of thin film characterization methods.
  • Basic principles of diffraction patterns and their interpretation.
NEXT STEPS
  • Research the principles of symmetrical grazing angle XRD techniques.
  • Learn about the locked couple mode in XRD and its applications.
  • Explore methods for optimizing in-plane measurements in thin film analysis.
  • Investigate the differences between out-of-plane and in-plane XRD techniques.
USEFUL FOR

Researchers and technicians in materials science, particularly those focused on thin film analysis and X-ray diffraction techniques.

nsoin
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Hi guys

I wanted to know if somebody can guide me on how to run a symmetrical grazing angle XRD on carbon thin films. I have been doing asymmetric grazing angle which predominantely measures diffraction pattern which is out of plane (normal) to the substrate. Now, I want to do an in-plane symmetric mode which could measure diffraction coming from planes parallel to the substrate, could somebody guide me on this ??
I have a vague idea that the inplane symmetric mode would be similar to a locked couple mode but I could be miles off :rolleyes: !
the system is a bruker d8 discover

thanks in advance !
 
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Hi, Sorry I don't know answer for your question. But I wanted to know how to do out of plane XRD. Means I wannt to avoid peaks from the planes which are normal to the substrate.
We have Grazing angle shimandzu thinfilm XRD.
If anybody know please help in this regard

Thanks In advance
 

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