Atomic Force Microscopy in hard and soft matter physics

[JD_PM]

I am studying the modes of operation of the Atomic Force Microscopy (AFM). I know there are three: contact, tapping and non-contact.

Are they really used in both hard and soft matter physics? If so, how are the difficulties/limitations that they present overcome?

 

[berkeman]

Can you post some links to the reading you've been doing about this so far? Thanks.

 

[JD_PM]

Yes, I have these papers:

https://www.ncbi.nlm.nih.gov/pubmed/21295764

https://www.nature.com/articles/nmat2442

https://www.ncbi.nlm.nih.gov/pubmed/20630173

But I have not seen any clear reference to the topic

 

[JD_PM]

OK after a little bit more reading I think that for soft samples the best is to use either non-contact or tapping mode, because prevents the sample from being damaged. However, what about hard samples?

In contact mode the probe will penetrate the liquid layer to image the underlying surface, whereas in non-contact mode an AFM will oscillate above the adsorbed fluid layer to image both the liquid and surface. So this suggests that for hard samples the best option is contact mode. Would not the contact mode still scratch the sample though?

 

[JD_PM]

OK after a little bit more reading I think that for soft samples the best is to use either non-contact or tapping mode, because prevents the sample from being damaged. However, what about hard samples?

In contact mode the probe will penetrate the liquid layer to image the underlying surface, whereas in non-contact mode an AFM will oscillate above the adsorbed fluid layer to image both the liquid and surface. So this suggests that for hard samples the best option is contact mode. Would not the contact mode still scratch the sample though?

Issue has been solved.