SUMMARY
This discussion focuses on the ellipsometric measurements of mirrors, specifically the values of Psi (ψ) and Delta (Δ) obtained when measuring a mirror using an Ellipsometer. The relationship between these angles is defined by the equation tan(ψ) exp(iΔ) = Rp/Rs, where Rp and Rs are the reflection coefficients for p-polarized and s-polarized light, respectively. The values of ψ and Δ are influenced by the complex refractive index and angle of incidence, and 'nulling ellipsometry' is utilized to assess changes in these angles when a substance adsorbs onto the reflective surface. Azzam and Bashara's book is recommended for in-depth understanding of ellipsometry.
PREREQUISITES
- Understanding of ellipsometric angles ψ and Δ
- Familiarity with reflection coefficients (Rp and Rs)
- Knowledge of complex refractive index
- Basic principles of nulling ellipsometry
NEXT STEPS
- Study the principles of ellipsometry in Azzam and Bashara's book
- Learn about the complex refractive index and its implications in optical measurements
- Research the technique of nulling ellipsometry and its applications
- Explore the effects of angle of incidence on ellipsometric measurements
USEFUL FOR
Researchers, optical engineers, and physicists interested in advanced optical measurement techniques and the characterization of reflective surfaces using ellipsometry.