Ellipsometric measurements on a mirror.

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SUMMARY

This discussion focuses on the ellipsometric measurements of mirrors, specifically the values of Psi (ψ) and Delta (Δ) obtained when measuring a mirror using an Ellipsometer. The relationship between these angles is defined by the equation tan(ψ) exp(iΔ) = Rp/Rs, where Rp and Rs are the reflection coefficients for p-polarized and s-polarized light, respectively. The values of ψ and Δ are influenced by the complex refractive index and angle of incidence, and 'nulling ellipsometry' is utilized to assess changes in these angles when a substance adsorbs onto the reflective surface. Azzam and Bashara's book is recommended for in-depth understanding of ellipsometry.

PREREQUISITES
  • Understanding of ellipsometric angles ψ and Δ
  • Familiarity with reflection coefficients (Rp and Rs)
  • Knowledge of complex refractive index
  • Basic principles of nulling ellipsometry
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  • Study the principles of ellipsometry in Azzam and Bashara's book
  • Learn about the complex refractive index and its implications in optical measurements
  • Research the technique of nulling ellipsometry and its applications
  • Explore the effects of angle of incidence on ellipsometric measurements
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Researchers, optical engineers, and physicists interested in advanced optical measurement techniques and the characterization of reflective surfaces using ellipsometry.

Hannavdwerk
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Hi,

During my internship I worked with an Ellipsometer.
Now I'm wondering, what values of Psi and Delta do you get when you measure a mirror under an Ellipsometer?
Are there any phaseshifts at all? Because there are no layers on the mirror right?
It's fully reflective in total..

Hanna
 
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It depends. Given a definition of the ellipsometric angles ψ and Δ as:

tan(ψ) exp(iΔ) = Rp/Rs,

Where Rp is the reflection coefficient for p-polarized light and Rs the coefficient for s-polarized light. ψ is then related to the ratio of reflectivities and Δ the relative phase shift experienced by s- and p-polarized light.

The reflectivities are given by the (complex) refractive index and angle of incidence, so ψ and Δ depend on both those quantities. Thus, 'nulling ellipsometry' is often used to measure how those angles change when something adsorbs onto the reflective surface by setting the instrument (compensator, polarizer, and analyzer angles), to zero when measuring the bare surface.

Azzam and Bashara's book has infinite detail about ellipsometry.
 

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