Synchrotron X-ray Measurements

AI Thread Summary
In synchrotron stations, X-ray characteristics such as wavelength and brightness are measured using stable and controlled X-ray sources. Measurement can occur simultaneously with application, but this may affect X-ray stability. Characterization before application is common, although it can be cumbersome. The transition between characterization and application is managed through specialized instruments that do not interfere with the X-ray beam. Continuous improvements in measurement methods are being developed to enhance efficiency in this field.
einstein1921
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I am curious about a question. in synchrotron station,people use x ray to do kinds of experiments.
They use the x ray ,how do they know the characteristic(like wavelength,brightness) of the ray they use. Does they measure the x ray when they use it simultaneously? Does this have an bad effect on
the stability of the x ray? if they characterization before application,is this too troublesome? how they actually change between characterization and application? Thank you!
 
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This is a well developed field in both engineering and science. The x-ray sources are very stable, and are controlled.

They are always working on improved methods; for example see:
http://www.aps.anl.gov/Science/Highlights/Content/APS_SCIENCE_20110331.php

You can explore Argonne here: http://www.aps.anl.gov/About/
 
UltrafastPED said:
This is a well developed field in both engineering and science. The x-ray sources are very stable, and are controlled.

They are always working on improved methods; for example see:
http://www.aps.anl.gov/Science/Highlights/Content/APS_SCIENCE_20110331.php

You can explore Argonne here: http://www.aps.anl.gov/About/

thank you sir,I have read the materials on the website! how do they measure x rays? after the measure, they should use them,but where is the measurement intruments. Does they block the
x ray or they are removed?
 
The first article tells you how they measure the X-rays.
 
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