Currently in our lab we have a WEDGE shaped sample that we would like to be able to know the thickness at various points along it. Our sample is about 5mm x 5mm. The wedge SHOULD extend from one side to the other. At the highest point, the wedge is 50nm, and then drops down, hopefully at a constant rate, to 0nm at the other side. **Special Note** The wedge is made of PZT and is between two layers of LSMO, with the layer on top of the wedge measuring a constant 5nm. We were thinking about using the XRR/XRD to find the thickness, but I've recently been told to try the Atomic Force Microscope because of our unique shape, and even perhaps the Scanning Electron Microscope. I have no personal experience using either the AFM or the SEM and have no idea how they would compare to using the XRR Thoughts/ Concerns from the forum please.